12.12.2012: SLcam User Workshop
Summer school for scanning electron microscopy and microanalysis in Lille, France
From 2-6 July 2012, GN MEBA, the French society for scanning electron microscopy and microanalysis, organised a summer school for scanning electron microscopy and microanalys in cooperation with the university of Lille, France. IfG - Institute for Scientific Instruments GmbH, together with French distributor SAMxPlus, demonstrated the possibilities of micro X-ray fluorescence analysis with iMOXS-SEM.
We thank all participants for the lively interest and discussions.
We have expanded our product portfolio and now offer Neutron Capillary Optics.
04.10.2011: Professor Norbert Langhoff honoured by the President of the Federal Republic of Germany
On 4 October 2011, Professor Norbert Langhoff was decorated with the Officer’s Cross of the Order of Merit of the Federal Republic of Germany by Federal President Christian Wulff. The ceremony in Schloss Bellevue, the official residence of the Federal President, honoured Norbert Langhoff’s outstanding civic involvement. The statement for this high honour reads:
The engineer, scientist and entrepreneur considerably contributed to the development of one of the most successful science and technology parks in reunified Germany, situated at the former location of the Academy of Science of the German Democratic Republic in Berlin Adlershof. He was consultant in the development of the Adlershof technology park, supported many start-ups and founded the “Institute for Scientific Instruments“. In addition, Professor Langhoff has been working in various honorary positions for a long time. For instance, in 1999 he initiated the foundation of „Institute for applied Photonics“, a non-profit research institution, whose chairman he is. Also, in 2000 he was one of the founding members of the nationally and internationally renowned competence network for optical technologies „Optec-Berlin-Brandenburg“.
24. - 25.11.2011
The 6th symposium for process-oriented X-ray-analysis will take place on 24th and 25th of November 2011 at the science and technology park Berlin Adlershof. Registration for participation and exhibition are possible with the attached announcement. Aims and content of the event can be taken from the announcement as well.
Program ProRA 2011
20.06.2011: New VDI/VDE-Standard for X-ray optical systems: VDI/VDE 5575
Initialised by IFG GmbH, a new guideline (standard) for „X-ray optical systems” has been drawn up by a group of experts, in which representatives from science, industry and administration are represented.
This standard respects all currently known physical effects which can be used for the manipulation of X-radiation. Within the guideline applications, physical basics and parameters are described in detail. The third part of VDI/VDE 5575 can be obtained from Beuth Verlag GmbH (www.beuth.de). Certification of X-ray capillaries by IFG GmbH is performed according to this standard.
10.12.2010 Winner of Innovationspreis Berlin Brandenburg!
From the original over 90 candidates finally seven innovations had been elected for the five categories of the award. At the award ceremony in the facilities of the BSR on 10 December 2010 the prize for the femtosecond X-ray source was given to IFG next to three other awardees.
The first prototype of PXS was developed in 2008 together with the group of Professor Thomas Elsässer from Max Born Institute. In the years 2009 and 2010 the device became a commercial product within a BMBF-Project together with the group of Prof. Bargheer from the University of Potsdam.
By giving the prize to IFG the jury acknowledged the high innovative potential of the product which generates X-ray pulses with a duration of down to 100 femtoseconds pulse-duration (1 femtosecond is 1 billionth of 1 millionth of one second) and allows scientists to perform experiments in laboratory scale, which else can only be performed at big devices like synchrotrons or free electron lasers.
IFG would like to thank all partners and especially the organizers of the Innovationspreis for this important prize.
Article from Tagesspiegel (in German)
Process on-line measuring procedure of zinc content in converter dust
In this paper, a process-oriented X-ray fluorescence spectrometer for on-line determination of zinc content in converter dust is described. This device was developed and manufactured by the companies Indutech instruments GmbH and IfG Institute for Scientific Instruments GmbH and installed at the voestalpine Stahl GmbH in Linz. In spite of extreme operational conditions for the device (high temperatures, mechanical vibrations, external electromagnetic fields etc.) a stable reproducibility of the measurement results and a long lifetime are guaranteed.
from "Stahl und Eisen"